Semiconductor Inspection Stand

Introducing the SWIR Vision Systems Semiconductor Inspection Tool, a solution to optimize semiconductor manufacturing processes. This system is a base configuration that can be extensively customized to align with the specifications of your application. For expert guidance in tailoring this platform to your needs, contact our sales team today.  

Features 

• High resolution SWIR imagery with our Acuros camera line 
• An array of lenses for microscopy or whole-wafer inspections 
• Flexible SWIR lighting arrangements 
• Modular inspection table, tailored to your application 
• Adjustable Z-axis 

• Optional X-Y translation stage for microscopy 
• Up to 300 mm wafer compatibility 
• Attractive pricing 

Options 

• Acuros 1920, 1280, or 640 resolutions 
• Zoom objective or wide FOV SWIR lenses 
• Backlighting or Bright Field SWIR lighting 
• Die or Wafer alignment on the inspection table 

onsemi Part Number (OPN): ACUROS-INSPECTION-STAND

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Silicon Inspection

SWIR Cameras

Product documentation